Section XVIII — Optical, photographic, cinematographic, measuring, checking, precision, medical or surgical instruments and apparatus; clocks and watches; musical instruments; parts and accessories thereof
Subheading
903082
For measuring or checking semiconductor wafers or devices (including integrated circuits)
Common commodities
Semiconductor wafer continuity checkerIC device parametric testerWafer probe station equipmentElectrical wafer performance analyzerIntegrated circuit testers for wafersAutomated semiconductor wafer inspectorSemiconductor chip electrical parameter checkerWafer parametric test and measurement systemWafer probe system for integrated circuitsChip electrical performance testing equipment
HS codes
| Code | Description | Taxes | |
|---|---|---|---|
| 90308200 | For measuring or checking semiconductor wafers or devices | Customs TaxCID, PAL, SSCL, VAT |